On-chip field testing methods and apparatus

US9836373B2 · kind B2 · utility

Assignee

• TEXAS INSTRUMENTS INCORPORATED · US

Inventors

• Srinivas Kumar Vooka · Bengaluru, IN
• Vishwanath S · Bengaluru, IN
• Pranav Murthy · Bengaluru, IN
• Ratheesh Thekke Veetil · Bengaluru, IN
• Rahul Gulati · San Diego, US

Key dates

• Filing date: Feb 24, 2015
• Grant date: Dec 5, 2017
• Expiry date: Apr 30, 2035

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31908
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

On-chip field testing methods and apparatus are disclosed. Example on-chip testers disclosed herein include a decoder having a test data input and a test stimuli interface. Disclosed example on-chip testers also include a multiplexer having a first multiplexer interface coupled to the test stimuli interface, a second multiplexer interface coupled to an automatic test equipment interface, a third multiplexer interface coupled to a design-for-testing subsystem interface and an interface selection input. Disclosed example on-chip testers further include a memory having a memory interface coupled to the test data input.