Srinivas Kumar Vooka
2Patents
1h-index
8Co-inventors
33Inventor score
Filing activity: Nov 3, 2010 → Feb 24, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8438437B2 | Structures and control processes for efficient generation of different test clocking sequences, controls and other test signals in scan designs with multiple partitions, and devices, systems and processes of making | Physics | 19 | Active |
| US9836373B2 | On-chip field testing methods and apparatus | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.