Ultra low temperature drift bandgap reference with single point calibration technique
US9851731B2 · kind B2 · utility
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3References
16Claims
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Key dates
| Filing date | Oct 31, 2014 |
| Grant date | Dec 26, 2017 |
| Priority date | — |
| Expiry date | Nov 29, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05F3/30
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A bandgap voltage generator includes a plurality of calibration transistors. A test circuit measures the bandgap reference voltage generated by the bandgap voltage generator and enables a subset of the calibration transistors to correct to the bandgap reference voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.