Semiconductor devices
US9859020B2 · kind B2 · utility
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1References
20Claims
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Assignee
Inventor
Key dates
| Filing date | Mar 1, 2016 |
| Grant date | Jan 2, 2018 |
| Priority date | — |
| Expiry date | Apr 2, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/36
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device includes a test data interface, a first data interface, and a second data interface. The test data interface generates first test data and second test data from data inputted through a test pad in response to a test control signal and outputs failure information to the test pad in response to a read control signal. The first data interface generates first aligned data from the first test data or the second test data in response to the test control signal. The second data interface generates second aligned data from the second test data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.