Patent · US Active

Imprint lithography

US9864279B2 · kind B2 · utility

2Cited by
5References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 14, 2011
Grant dateJan 9, 2018
Priority date
Expiry dateJul 3, 2034

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB29C2043/142
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.