Integrated circuit test temperature control mechanism
US9869714B2 · kind B2 · utility
8Cited by
6References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 17, 2016 |
| Grant date | Jan 16, 2018 |
| Priority date | — |
| Expiry date | Jun 17, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2642
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A thermal controller includes a thermal control interface to receive test data from an automated test equipment (ATE) system and dynamically adjust a target setpoint temperature based on the data and a dynamic thermal controller to receive the target setpoint temperature from the thermal control interface and control a thermal actuator based on the target setpoint temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.