Patent · US Active

Method for tuning the effective work function of a metal

US9892923B2 · kind B2 · utility

1Cited by
8References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 22, 2015
Grant dateFeb 13, 2018
Priority date
Expiry dateDec 22, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/691
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The disclosed technology generally relates to integrated circuit devices and methods of forming the same, and more particularly to metal electrodes whose effective work function can be tuned. In one aspect, a method of forming a metal electrode of a semiconductor structure includes providing a semiconductor substrate having at least a region covered with a dielectric. The semiconductor substrate is introduced into a chamber configured for atomic layer deposition (ALD). A metal for the metal electrode is deposited at least on the dielectric by performing an ALD cycle. Performing the ALD cycle includes pulsing a Ti-containing precursor gas followed by pulsing a Ta-containing precursor gas, and further includes pulsing NH3 gas.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.