Biasing method and device construction for a spring probe
US9910069B1 · kind B1 · utility
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3References
4Claims
0Family size
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Key dates
| Filing date | Apr 24, 2015 |
| Grant date | Mar 6, 2018 |
| Priority date | — |
| Expiry date | Feb 23, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06722
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for testing integrated circuits utilizing a compression spring that has one longitudinal centerline that is concentric to the housing of the test probe and terminates in a number of reduced diameter coil windings that are non-concentric to the housing so as to provide a side load to the probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.