Patent · US Active

Cleaning liquid for lithography and method for forming wiring

US9920286B2 · kind B2 · utility

2Cited by
2References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 29, 2016
Grant dateMar 20, 2018
Priority date
Expiry dateMay 28, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02068
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

A cleaning liquid for lithography, and a method for forming a wiring using the cleaning liquid for lithography. The cleaning liquid for includes an alkali or an acid, a solvent, and a silicon compound generating a silanol group through hydrolysis. The method forms a metal wiring layer by embedding a metal in an etching space formed in a low dielectric constant layer of a semiconductor multilayer laminate. In this method, the semiconductor multilayer laminate is cleaned using the cleaning liquid for lithography, after formation of the etching space.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.