X-ray diffraction imaging system using debye ring envelopes
US9921173B2 · kind B2 · utility
3Cited by
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17Claims
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Key dates
| Filing date | Jan 2, 2014 |
| Grant date | Mar 20, 2018 |
| Priority date | — |
| Expiry date | Jun 15, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample (106) is irradiated with electromagnetic radiation such as X-Rays and diffraction data is sampled at inner and outer caustic rims formed at a sensor surface (108) and defined by a continuum of Debye cones (130, 132) formed by diffraction of the incident radiation. Intensities of the inner and outer rims while translating and rotating the sample are converted using a tomographic technique into X-ray diffraction images and material discrimination is also possible.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.