Patent · US Active

Apparatus and method for FinFETs

US9922828B2 · kind B2 · utility

0Cited by
13References
20Claims
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Key dates

Filing dateJan 20, 2017
Grant dateMar 20, 2018
Priority date
Expiry dateJan 20, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/834
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method comprises performing a surface treatment on a plurality of recesses in a substrate to form a first cloak-shaped recess, a second cloak-shaped recess and a third cloak-shaped recess, wherein each cloak-shaped recess is between two isolation regions over the substrate and growing a semiconductor material in the first cloak-shaped recess, the second cloak-shaped recess and the third cloak-shaped recess to form a first cloak-shaped active region, a second cloak-shaped active region and a third cloak-shaped active region, wherein the first cloak-shaped active region has a first non-planar top surface, the second cloak-shaped active region has a second non-planar top surface and the third cloak-shaped active region has a third non-planar top surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.