Patent · US Active

System and method for generation of an integrated circuit design

US9928321B2 · kind B2 · utility

0Cited by
9References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 14, 2016
Grant dateMar 27, 2018
Priority date
Expiry dateOct 14, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/333
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for verification of a design of an electronic circuit is provided. The method includes executing test runs of the design. The method further includes increasing a fail counter if the executing of a test run of the test runs failed. The method further includes increasing a pass counter if the executing of the test run of the test runs passed. The method further includes halting the executing of the test runs of the design if the current ratio of the fail counter versus the pass counter exceeds a predetermined threshold.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.