Patent · US Active

Analyzer alignment, sample detection, localization, and focusing method and system

US9939383B2 · kind B2 · utility

4Cited by
21References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 5, 2016
Grant dateApr 10, 2018
Priority date
Expiry dateFeb 22, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/0833
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An analysis (e.g., LIBS) system includes a source of radiation, an optical emission path for the radiation from the source of radiation to a sample, and an optical detection path for photons emitted by the sample. A detector fiber bundle transmits photons to the spectrometer subsystem. At least one fiber of the fiber bundle is connected to an illumination source (e.g., an LED) for directing light via at least a portion of the detection path in a reverse direction to the sample for aligning, sample presence detection, localizing, and/or focusing based on analysis of the resulting illumination spot on the sample.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.