Measurement scale with periodic nanostructure
US9945697B2 · kind B2 · utility
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11References
36Claims
0Family size
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Key dates
| Filing date | Jan 13, 2014 |
| Grant date | Apr 17, 2018 |
| Priority date | — |
| Expiry date | Feb 6, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/344
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement scale device includes at least one scale marking, wherein the or each scale marking includes at least one periodic nanostructure that represents scale device information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.