Method of finding a feature using a machine tool
US9952028B2 · kind B2 · utility
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30References
19Claims
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Key dates
| Filing date | May 25, 2017 |
| Grant date | Apr 24, 2018 |
| Priority date | — |
| Expiry date | May 25, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of finding a feature of an object using an analog probe mounted on a machine tool. The method includes the analog probe and/or object following a course of motion which causes the analog probe's surface sensing region to traverse across the feature to be found a plurality of times while approaching the feature over successive traverses so as to ultimately arrive in a position sensing relationship with the feature so as to collect scanned measurement data about the feature along at least part of a traverse.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.