Fast quasi-parity checker for correlated electron switch (CES) memory array
US9953726B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 28, 2016 |
| Grant date | Apr 24, 2018 |
| Priority date | — |
| Expiry date | Nov 28, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C13/0002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An apparatus is provided for testing storage elements that include a variable impedance element switchable between a first impedance state and a second impedance state. The apparatus includes an interconnect circuit for coupling storage elements in a selected arrangement. The apparatus includes an impedance sensing circuit operable to measure at least a resistive component of an impedance of the coupled storage elements and a test controller operable to configure the interconnect circuit and initiate measurement of the combined impedance of the coupled storage elements by the impedance sensing circuit. The impedance sensing circuit compares the measured impedance with at least a resistive component of an expected impedance. The storage elements and apparatus may form part of an integrated circuit. A storage element may include a correlated electron switch, for example.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.