Patent · US Active

Spin chuck with in situ cleaning capability

US9968970B2 · kind B2 · utility

0Cited by
4References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 4, 2015
Grant dateMay 15, 2018
Priority date
Expiry dateFeb 15, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68792
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a method and apparatus for processing wafer-shaped articles, a spin chuck is positioned inside a process chamber. The spin chuck is configured to hold a wafer-shaped article at a predetermined process position. A cover covers the spin chuck and is affixed to or integral with the spin chuck for rotation therewith. The cover has a central opening. A stationary nozzle assembly extends into the process chamber such that a discharge end of the stationary nozzle assembly passes through the central opening of the cover. The nozzle assembly comprises a rinse nozzle configured to direct rinse liquid radially outwardly of the nozzle assembly onto a downwardly-facing surface of the cover.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.