Dual source analyzer with single detector
US9970876B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 22, 2012 |
| Grant date | May 15, 2018 |
| Priority date | — |
| Expiry date | Mar 17, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/274
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A dual source system and method includes a high power laser used to determine elements in a sample and a lower power device used to determine compounds present in the sample. An optical subsystem directs photons from a sample to a detector subsystem after laser energy from the laser strikes the sample along an optical path. After energy from the device strikes the sample protons are directed to the detector subsystem along the same optical path. The detector subsystem receives photons after laser energy from the laser strikes the sample and provides a first signal, and receives photons after energy from the device strikes the sample and provides a second signal. A controller subsystem pulses the high power laser and processes the first signal to determine elements present in the sample, energizes the lower power device and processes the second signal to determine compounds present in the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.