Patent · US Active

Systems and methods for time of flight measurement using a single exposure

US9971023B2 · kind B2 · utility

2Cited by

2References

20Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Markus Dielacher · Graz, AT
Josef Prainsack · Graz, AT
Martin Flatscher · Graz, AT
Michael Mark · Montréal, CA
Hartwig Unterassinger · Graz, AT

Key dates

Filing date	May 4, 2015
Grant date	May 15, 2018
Priority date	—
Expiry date	Jul 20, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01S17/894
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A sensor array arrangement for a time of flight measurement system is disclosed. The arrangement includes a plurality of pixels and circuitry. The plurality of pixels are configured such that a first plurality of pixels receive a first reference signal and a second plurality of pixels receive a second reference signal. The first and second reference signals are phase shifted with respect to each other. The circuitry calculates depth information by combining information from first and second pixel sensor signals. The first pixel sensor signal is based on the first reference signal. The second pixel sensor signal is based on the second reference signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.