Integrated circuit reliability assessment apparatus and method
US9977075B1 · kind B1 · utility
3Cited by
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16Claims
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Key dates
| Filing date | Nov 23, 2016 |
| Grant date | May 22, 2018 |
| Priority date | — |
| Expiry date | Nov 23, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments detailed herein include an apparatus that includes a reliability assessment engine (RAE) stored in non-volatile memory and processing circuitry to execute the RAE to: receive data of at least one physical condition from a plurality of intra-die variation monitoring circuits, apply the received data least one to at least one reliability physics model, and calculate at least one of an estimated amount of lifetime consumed and an estimated amount of lifetime remaining.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.