Controlling signal path inductance in automatic test equipment

US9989584B2 · kind B2 · utility

Assignee

• Teradyne, Inc. · US

Inventors

• Jack E. Weimer · Gurnee, US
• Steven Price · Albany, US
• David R. Hanna · Troy, US
• Jeffry Baenen · Waukegan, US
• Scott Skibinski · Zion, US

Key dates

• Filing date: Jul 11, 2014
• Grant date: Jun 5, 2018
• Expiry date: May 3, 2035

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/34
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Example automatic test equipment (ATE) may include: a device interface board (DIB) on which the DUT is mounted; a system for sending signals to, and receiving signals from, the DUT; and an energy source unit (ESU) to provide current to the DUT via the DIB, where the ESU includes current paths to provide the current, and where the current paths are configured to limit a combined inductance of the current paths.