API-based pattern-controlled test on an ATE
US9989591B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 15, 2015 |
| Grant date | Jun 5, 2018 |
| Priority date | — |
| Expiry date | Aug 13, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2736
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and apparatus for performing Pattern-Controlled tests on an automatic test equipment (ATE). The ATE includes a diagnostic instrument and a control device. An application programming interface (API) is installed in the control device and operates to interact with a test program and thereby automatically controls the diagnostic instrument to perform a test. The test program is coded in a high-level programming language and defines a plurality of operation events for the test based on user input. The API identifies the operational events and determines respective operational types associated therewith. Events of an operational type are assigned to a respective pattern label. The pattern labels are then aggregated into a pattern burst which is downloaded to the diagnostic instrument.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.