Systems and methods using neighboring sample points in memory subsystem calibration
US9990973B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 17, 2017 |
| Grant date | Jun 5, 2018 |
| Priority date | — |
| Expiry date | Feb 17, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2207/2254
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for using neighboring sampling points in a memory subsystem calibration is disclosed. In one embodiment, a memory subsystem includes a memory and a memory controller coupled thereto. A calibration unit in the memory controller is configured to perform calibrations of a data strobe signal and a reference voltage to determine eye openings for signals conveyed between the memory and the memory controller. Performing the calibration includes determining a number of different calibration points and computing initial scores for each of the calibration points. The method further includes calculating adjusted scores for each calibration point. For a given calibration point, the adjusted score includes weighted values of one or more calibration points that are adjacent thereto. The method further includes selecting a calibration point having the highest adjusted score as the calibrated value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.