Patent · US Active

Dark bits to reduce physically unclonable function error rates

US9992031B2 · kind B2 · utility

2Cited by

7References

19Claims

0Family size

Assignee

Intel Corporation · US

Inventors

Kevin C. Gotze · Poughkeepsie, US
Gregory M. Iovino · Hillsboro, US
David Johnston · Beaverton, US
Patrick Koeberl · Hähnlein, DE
Jiangtao Li · Beaverton, US
Wei Wu · Portland, US

Key dates

Filing date	Sep 27, 2013
Grant date	Jun 5, 2018
Priority date	—
Expiry date	Jun 1, 2034

Classification

Technology area (CPC H)Electricity
CPC primaryH04L2209/12
WIPO fieldDigital communication
WIPO sectorElectrical engineering

Abstract

Embodiments of an invention for using dark bits to reduce physically unclonable function (PUF) error rates are disclosed. In one embodiment, an integrated circuit includes a PUF cell array and dark bit logic. The PUF cell array is to provide a raw PUF value. The dark bit logic is to select PUF cells to mark as dark bits and to generate a dark bit mask based on repeated testing of the PUF cell array.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.