Automatic semiconductor wafer tester
USD292979S · kind S · design
9Cited by
7References
1Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 26, 1985 |
| Grant date | Dec 1, 1987 |
| Priority date | — |
| Expiry date | Dec 1, 2001 |
Classification
- Technology area (CPC —)General
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.