Prometrix Corporation
19Patents
0Active
19Granted
35Portfolio score
Filing activity: Feb 22, 1985 → Aug 20, 1999
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5486701A | Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness | Physics | 317 | Expired |
| US4873623A | Process control interface with simultaneously displayed three level dynamic menu | Physics | 259 | Expired |
| US5226118A | Data analysis system and method for industrial process control systems | Emerging Cross-Sectional Technologies | 203 | Expired |
| US4755746A | Apparatus and methods for semiconductor wafer testing | Electricity | 160 | Expired |
| US4967381A | Process control interface system for managing measurement data | Physics | 158 | Expired |
| US4843538A | Multi-level dynamic menu which suppresses display of items previously designated as non-selectable | Physics | 116 | Expired |
| US5067805A | Confocal scanning optical microscope | Physics | 73 | Expired |
| US4679137A | Process control interface system for designer and operator | Physics | 68 | Expired |
| US4945220A | Autofocusing system for microscope having contrast detection means | Physics | 65 | Expired |
| US4805089A | Process control interface system for managing measurement data | Physics | 64 | Expired |
| US4907931A | Apparatus for handling semiconductor wafers | Emerging Cross-Sectional Technologies | 33 | Expired |
| US4776695A | High accuracy film thickness measurement system | Physics | 31 | Expired |
| US4951190A | Multilevel menu and hierarchy for selecting items and performing tasks thereon in a computer system | Physics | 30 | Expired |
| US5260668A | Semiconductor surface resistivity probe with semiconductor temperature control | Physics | 23 | Expired |
| US4703252A | Apparatus and methods for resistivity testing | Physics | 23 | Expired |
| US5386317A | Method and apparatus for imaging dense linewidth features using an optical microscope | Emerging Cross-Sectional Technologies | 23 | Expired |
| USD432159S | Coin counting and sorting apparatus | General | 11 | Expired |
| USD292979S | Automatic semiconductor wafer tester | General | 9 | Expired |
| USD434202S | Coin redemption apparatus | General | 2 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.