Patent · US Expired

Electrical test probe

USD334147S · kind S · design

8Cited by
4References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 13, 1990
Grant dateMar 23, 1993
Priority date
Expiry dateMar 23, 2007

Classification

  • Technology area (CPC —)General

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.