Semiconductor integrated circuit test head
USD511981S1 · kind S1 · design
1Cited by
3References
1Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2004 |
| Grant date | Nov 29, 2005 |
| Priority date | — |
| Expiry date | Nov 29, 2019 |
Classification
- Technology area (CPC —)General
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.