Coating thickness gauge

USRE41342E1 · kind E1 · reissue

Assignee

• DeFelsko Corporation · US

Inventors

• Frank Koch · Osterode, DE
• Leon C. Vandervalk · Brockville, CA
• David Beamish · Mississauga, CA

Key dates

• Filing date: Apr 3, 2000
• Grant date: May 18, 2010
• Expiry date: Apr 3, 2020

Classification

• Technology area (CPC —): General

Abstract

A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.