Full-water test and burn-in mechanism
USRE46075E1 · kind E1 · reissue
Assignee
Inventor
Key dates
| Filing date | May 18, 2012 |
| Grant date | Jul 19, 2016 |
| Priority date | — |
| Expiry date | May 18, 2032 |
Classification
- Technology area (CPC —)General
Abstract
Assemblies include a substrate, such as a printed circuit board, with a first array of contact pads disposed thereon; a guide ring structure disposed on the substrate and at least partially surrounding the first array of contact pads; a translator socket disposed on the first array of contact pads, the translator socket adapted to receive the tester side of a translated wafer; a thermally conductive, conformal, heat spreading cushion adapted to be disposed over the backside of a wafer; a cover plate adapted to fit over the first array of contact pads, align with the guide ring structure, contain within it the various components disposed over the first array of contact pads, and removably attach to the substrate; and a bolster plate adapted to removably attach to a second side of the substrate. In a further aspect a translated wafer is disposed over the translator socket such that the tester side of the translator is in contact with the translator socket; and the heat spreading cushion is disposed over the backside of the translated wafer. In a still further aspect, the substrate includes signal communication means, such as but not limited to, an edge connector adapted to couple to …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.