TRANSLARITY, INC.
10Patents
10Active
10Granted
47Portfolio score
Filing activity: Mar 10, 2011 → Nov 30, 2016 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9052355B2 | Wafer prober integrated with full-wafer contactor | Physics | 2 | Active |
| US9494618B2 | Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methods | Electricity | 1 | Active |
| US10281491B2 | Probe card for testing semiconductor wafers | Physics | 1 | Active |
| US9612278B2 | Wafer prober integrated with full-wafer contacter | Physics | 0 | Active |
| US9176186B2 | Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed | Physics | 0 | Active |
| US9733272B2 | Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methods | Electricity | 0 | Active |
| US9146269B2 | Maintaining a wafer/wafer translator pair in an attached state free of a gasket diposed | Physics | 0 | Active |
| US9612259B2 | Wafer testing system and associated methods of use and manufacture | Physics | 0 | Active |
| USRE46075E1 | Full-water test and burn-in mechanism | General | 0 | Active |
| US9222965B2 | Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methods | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.