IC ANALYTICA, LLC
2Patents
2Active
2Granted
51Portfolio score
Filing activity: Jun 24, 2022 → Jun 24, 2022
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12007429B2 | Apparatus and method for managing power of test circuits | Physics | 0 | Active |
| US12153087B2 | Apparatus and method for testing all test circuits on a wafer from a single test site | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.