Lithoptek LLC
3Patents
3Active
3Granted
46Portfolio score
Filing activity: Aug 31, 2016 → Oct 22, 2018
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10503083B2 | Apparatus and method for using scanning light beam for film or surface modification | Physics | 1 | Active |
| US10108096B2 | Apparatus and method for using scanning light beam for film or surface modification | Physics | 1 | Active |
| US10145672B2 | Detection of position, orientation and scale of work pieces using retroreflective surfaces | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.