Patent · US Active

Detection of position, orientation and scale of work pieces using retroreflective surfaces

US10145672B2 · kind B2 · utility

0Cited by

16References

34Claims

0Family size

Assignee

Lithoptek LLC · US

Inventors

Mark Schattenburg · Wayland, US
Rudolf H. Hendel · Summit, US
Paul Glenn · Wellesley, US
John Glenn · Carlisle, US

Key dates

Filing date	Jan 24, 2017
Grant date	Dec 4, 2018
Priority date	—
Expiry date	Jan 24, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01B11/002
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and apparatus in which retroreflective materials and surfaces are used for determining the position, orientation and scale of work pieces in order to accurately place process beams thereon for the purpose of surface patterning or treatment.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.