Negevtech, Ltd.
10Patents
4Active
10Granted
36Portfolio score
Filing activity: Dec 16, 2002 → Aug 22, 2007 · 4 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6693664B2 | Method and system for fast on-line electro-optical detection of wafer defects | Physics | 16 | Expired |
| US6892013B2 | Fiber optical illumination system | Physics | 16 | Expired |
| US7180586B2 | System for detection of wafer defects | Physics | 15 | Expired |
| US7369236B1 | Defect detection through image comparison using relative measures | Physics | 13 | Active |
| US7274444B2 | Multi mode inspection method and apparatus | Physics | 9 | Expired |
| US7525659B2 | System for detection of water defects | Physics | 8 | Expired |
| US7260298B2 | Fiber optical illumination system | Physics | 4 | Expired |
| US7477383B2 | System for detection of wafer defects | Physics | 3 | Active |
| US7486861B2 | Fiber optical illumination system | Physics | 1 | Active |
| US7480039B2 | Multi mode inspection method and apparatus | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.