Opal Technologies Ltd.
3Patents
0Active
3Granted
30Portfolio score
Filing activity: Jul 6, 1992 → Feb 23, 1996
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5659172A | Reliable defect detection using multiple perspective scanning electron microscope images | Electricity | 92 | Expired |
| US5466940A | Electron detector with high backscattered electron acceptance for particle beam apparatus | Electricity | 31 | Expired |
| US5311288A | Method and apparatus for detecting surface deviations from a reference plane | Physics | 22 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.