SEMICS INC.
6Patents
6Active
6Granted
42Portfolio score
Filing activity: Jun 11, 2008 → Jan 15, 2019 · 2 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8368414B2 | Method and apparatus for controlling position of Z-axis for wafer prober | Physics | 3 | Active |
| US8810270B2 | Wafer probe station capable of actively controlling tilt of chuck and controlling method thereof | Physics | 3 | Active |
| US9054267B2 | Method of manufacturing light absorbing layer for solar cell using selenization process under element selenium vapor ambience and thermal treatment apparatus for manufacturing light absorbing layer | Emerging Cross-Sectional Technologies | 0 | Active |
| US11262380B2 | Wafer prober | Electricity | 0 | Active |
| US8452563B2 | Apparatus for measuring and calibrating error of wafer prober | Physics | 0 | Active |
| US8993371B2 | Method of manufacturing light absorbing layer for solar cell using selenization process under element selenium vapor ambience and thermal treatment apparatus for manufacturing light absorbing layer | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.