Aaron Rosenberg
6Patents
2h-index
22Co-inventors
43Inventor score
Filing activity: Aug 8, 2017 → Jul 1, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10794839B2 | Visualization of three-dimensional semiconductor structures | Electricity | 3 | Active |
| US11573077B2 | Scatterometry based methods and systems for measurement of strain in semiconductor structures | Physics | 3 | Active |
| US11099137B2 | Visualization of three-dimensional semiconductor structures | Electricity | 2 | Active |
| US11378451B2 | Bandgap measurements of patterned film stacks using spectroscopic metrology | Physics | 1 | Active |
| US11060846B2 | Scatterometry based methods and systems for measurement of strain in semiconductor structures | Physics | 0 | Active |
| US11796390B2 | Bandgap measurements of patterned film stacks using spectroscopic metrology | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.