Alexander G. Carver
4Patents
2h-index
5Co-inventors
33Inventor score
Filing activity: Jul 16, 2007 → Aug 15, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8828852B2 | Delta-doping at wafer level for high throughput, high yield fabrication of silicon imaging arrays | Emerging Cross-Sectional Technologies | 2 | Active |
| US8261690B2 | In-situ flux measurement devices, methods, and systems | Chemistry; Metallurgy | 2 | Active |
| US8377518B2 | In-situ flux measurement devices, methods, and systems | Chemistry; Metallurgy | 1 | Active |
| US8360002B2 | In-situ flux measurement devices, methods, and systems | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.