Andreas Ehlert
3Patents
2h-index
8Co-inventors
30Inventor score
Filing activity: May 25, 1999 → Apr 2, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6362487B1 | Method and device for nondestructive detection of crystal defects | Electricity | 5 | Expired |
| US6416393B2 | Process for producing a semiconductor wafer | Performing Operations; Transporting | 3 | Expired |
| US6267815A | Method for pulling a single crystal | Chemistry; Metallurgy | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.