Andreas Kluwe
2Patents
2h-index
5Co-inventors
30Inventor score
Filing activity: Jun 30, 1997 → Nov 21, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5899706A | Method of reducing loading variation during etch processing | Emerging Cross-Sectional Technologies | 29 | Expired |
| US6492247B1 | Method for eliminating crack damage induced by delaminating gate conductor interfaces in integrated circuits | Electricity | 19 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.