Andrei Tkachuk
5Patents
5h-index
14Co-inventors
49Inventor score
Filing activity: Dec 11, 2006 → Apr 9, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8068579B1 | Process for examining mineral samples with X-ray microscope and projection systems | Physics | 64 | Active |
| US7813475B1 | X-ray microscope with switchable x-ray source | Electricity | 48 | Active |
| US7796725B1 | Mechanism for switching sources in x-ray microscope | Electricity | 47 | Active |
| US7443953B1 | Structured anode X-ray source for X-ray microscopy | Electricity | 45 | Active |
| US8139846B2 | Verification of integrated circuits against malicious circuit insertions and modifications using non-destructive X-ray microscopy | Physics | 13 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.