Verification of integrated circuits against malicious circuit insertions and modifications using non-destructive X-ray microscopy
US8139846B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Nov 5, 2008 |
| Grant date | Mar 20, 2012 |
| Priority date | — |
| Expiry date | Jul 18, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for verifying the integrity of integrated circuits (ICs) by detecting the presence of unauthorized circuit insertions or modifications using non-destructive x-ray microscopy is disclosed. A reference image based on a trusted IC or a trusted design file may be generated. An un-trusted IC may be received from an un-trusted foundry, which IC is manufactured in response to the trusted design file provided to the foundry. An x-ray microscope may record a plurality of sets of base images of the un-trusted IC, each set corresponding to a different viewing angle. One or more un-trusted images may be produced from the base images. The reference images may be compared with the un-trusted images to illuminate any additions or modifications in circuit elements or other parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.