Mechanism for switching sources in x-ray microscope
US7796725B1 · kind B1 · utility
47Cited by
1References
12Claims
0Family size
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Key dates
| Filing date | Mar 11, 2009 |
| Grant date | Sep 14, 2010 |
| Priority date | — |
| Expiry date | Mar 11, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2235/00
- WIPO fieldEngines, pumps, turbines
- WIPO sectorMechanical engineering
Abstract
An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive detector system, placed on a fixed optical table and a mechanical translation stage system to switch x-ray sources when synchrotron radiation beam is not available.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.