Anil Malik
6Patents
2h-index
8Co-inventors
36Inventor score
Filing activity: Mar 31, 2015 → Mar 17, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9400311B1 | Method and system of collective failure diagnosis for multiple electronic circuits | Physics | 10 | Active |
| US10338137B1 | Highly accurate defect identification and prioritization of fault locations | Physics | 2 | Active |
| US9864004B1 | System and method for diagnosing failure locations in electronic circuits | Physics | 2 | Active |
| US10996270B1 | System and method for multiple device diagnostics and failure grouping | Physics | 1 | Active |
| US11592482B1 | Scan channel slicing for compression-mode testing of scan chains | Physics | 1 | Active |
| US10180457B1 | System and method performing scan chain diagnosis of an electronic design | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.