Anton Riley
2Patents
1h-index
5Co-inventors
33Inventor score
Filing activity: Dec 30, 2011 → May 9, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8800998B2 | Semiconductor wafer isolated transfer chuck | Emerging Cross-Sectional Technologies | 3 | Active |
| US10139429B2 | Method for calibrating and imaging using multi-tip scanning probe microscope | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.