Inventor · Manhattan, NY, US

Anuj Doshi

3Patents
1h-index
2Co-inventors
24Inventor score

Filing activity: Oct 7, 2022 → Aug 14, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US11727672B1 System and method for generating training data sets for specimen defect detection Physics 1 Active
US12387317B2 Artificial intelligence process control for assembly processes Physics 0 Active
US12243293B2 System and method for generating training data sets for specimen defect detection Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.