System and method for generating training data sets for specimen defect detection
US11727672B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 7, 2022 |
| Grant date | Aug 15, 2023 |
| Priority date | — |
| Expiry date | Oct 7, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for generating a training data set for training a machine learning model to detect defects in specimens is described herein. A computing system cause presentation of an image on a device of a user. The image includes at least one defect on an example specimen. The computing system receives an annotated image from the user. The user annotated the image using an input via the device. The input includes a first indication of a location of the defect and a second indication of a class corresponding to the defect. The computing system adjusts the annotated image to standardize the input based on an error profile of the user and the class corresponding to the defect. The computing system uploads the annotated image for training the machine learning model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.