Arnold A. Cruz
2Patents
2h-index
3Co-inventors
30Inventor score
Filing activity: Mar 27, 2003 → Feb 23, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6943581B1 | Test methodology for direct interconnect with multiple fan-outs | Physics | 10 | Expired |
| US7626874B1 | Method and apparatus for testing a memory device with a redundant self repair feature | Physics | 6 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.