Aron Cepler
3Patents
0h-index
10Co-inventors
31Inventor score
Filing activity: Jun 22, 2016 → Feb 23, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11295969B2 | Hybridization for characterization and metrology | Physics | 0 | Active |
| US10534275B2 | Method for use in process control of manufacture of patterned sample | Electricity | 0 | Active |
| US12165023B2 | Measuring local CD uniformity using scatterometry and machine learning | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.